Target Paper: Decision tree ensemble-based wafer map failure pattern recognition based on radon transform-based features

Reference 1: A voting ensemble classifier for wafer map defect patterns identification in semiconductor manufacturing

Reference 2: Feature extraction using radon transform and discrete wavelet transform for facial emotion recognition

발표 자료: https://koreaoffice-my.sharepoint.com/:b:/g/personal/kjw940220_korea_edu/EXb98r1K76pFjZ2iqbx6ohQBxx-Pe5lwpWAwJLFuznTT2A?e=GSjb1t