[1] Nam, J., Cha, H., Ahn, S., Lee, J., & Shin, J. (2020). Learning from failure: De-biasing classifier from biased classifier. Advances in Neural Information Processing Systems, 33, 20673-20684.

[2] Jang, T., & Wang, X. (2023). Difficulty-Based Sampling for Debiased Contrastive Representation Learning. In Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition (pp. 24039-24048).

발표자 - 이유진

발표 자료 링크 - https://www.youtube.com/watch?v=H--ujcJahBk